PEROXIDE ‘TOTAL’ FUSION ANALYSIS

Sodium peroxide fusion will result in a total metal recovery and is effective for the decomposition of sulphides and refractory minerals.

For nickel sulphide deposits this is the preferred method. This method is not suitable if sodium is required. 8-4-Acid is recommended if sodium is required.

Samples are fused with sodium peroxide in a Zirconium crucible. The fused sample is acidified with concentrated nitric and hydrochloric acids. The resulting solutions are diluted and then measured by ICP-OES and ICP-MS. All metals are solubilized.

ICP-MS

Fused samples are diluted and analyzed by ICP-MS. Calibration is performed using five synthetic calibration standards. A set of (10-20) fused certified reference material is run with every batch of samples for calibration and quality control. Fused duplicates are run every 10 samples.

ICP-OES

Samples are analyzed with a minimum of 10 certified reference materials for the required analytes, all prepared by sodium peroxide fusion. Every 10th sample is prepared and analyzed in duplicate; a blank is prepared every 30 samples and analyzed. Samples are analyzed using an ICP and internal standards are used as part of the standard operating procedure.  

Elements and Detection Limits (ppm)

ElementDetection LimitUpper LimitReported By
Al0.01%25%ICP
As510,000ICP/MS
B510,000ICP/MS
Ba210,000ICP/MS
Be15,000ICP/MS
Bi15,000ICP/MS
Ca0.02%40%ICP
Cd15,000ICP/MS
Ce0.85,000ICP/MS
Cs0.525,000ICP/MS
Cu210,000ICP/MS
Co0.55,000ICP/MS
Cr3010,000ICP/MS
Dy0.25,000ICP/MS
Eu0.051,000ICP/MS
Er0.15,000ICP/MS
Fe0.01%30%ICP
Ga0.15,000ICP/MS
Ge0.15,000ICP/MS
Gd0.055,000ICP/MS
Hf105,000ICP/MS
Ho0.11,000ICP/MS
In0.11,000ICP/MS
K0.10%25%ICP
La0.410,000ICP/MS
Mg0.01%30%ICP
Mn410,000ICP/MS
Li350,000ICP/MS
ElementDetection LimitUpper LimitReported By
Mo110,000ICP/MS
Nb15,000ICP/MS
Nd0.45,000ICP/MS
Ni1010,000ICP/MS
P0.001%4%ICP
Pb15,000ICP/MS
Pr0.11,000ICP/MS
Rb0.45,000ICP/MS
S0.01%25%ICP
Sb0.55,000ICP/MS
Se15,000ICP/MS
Si0.02%30%ICP
Sm0.051,000ICP/MS
Sn0.510,000ICP/MS
Sr310,000ICP/MS
Ta0.510,000ICP/MS
Tb0.051,000ICP/MS
Te510,000ICP/MS
Th0.11,000ICP/MS
Ti0.01%25%ICP
Tl0.051,000ICP/MS
Tm0.051,000ICP/MS
U0.110,000ICP/MS
V210,000ICP/MS
W0.65,000ICP/MS
Y0.051,000ICP/MS
Yb0.051,000ICP/MS
Zn1010,000ICP

Samples are fused with sodium peroxide in a Zirconium crucible. The fused sample is acidified with concentrated nitric and hydrochloric acids. The resulting solutions are diluted and then measured by ICP-OES. All metals are solubilized.

ICP-OES

Samples are analyzed with a minimum of 10 certified reference materials for the required analytes, all prepared by sodium peroxide fusion. Every 10th sample is prepared and analyzed in duplicate; a blank is prepared every 30 samples and analyzed. Samples are analyzed using an ICP and internal standards are used as part of the standard operating procedure.

Elements and Detection Limits (ppm)

ElementDetection LimitUpper LimitReported By
Al0.0125%ICP
As3010,000ICP
B20010,000ICP
Ba410,000ICP
Be25,000ICP
Bi105,000ICP
Ca0.0240%ICP
Cd0.55,000ICP
Ce305,000ICP
Co205,000ICP
Cr2010,000ICP
Cu1010,000ICP
Fe0.0130%ICP
Ga155,000ICP
K0.1025%ICP
La310,000ICP
Li1050,000ICP
Mg0.0130%ICP
Mn1010,000ICP
Mo210,000ICP
Ni5010,000ICP
P0.0014%ICP
Pb205,000ICP
S0.0125%ICP
Sb155,000ICP
Sc55,000ICP
Se505,000ICP
Si0.0230%ICP
Sn1010,000ICP
Sr510,000ICP
Te6010,000ICP
Th601,000ICP
Ti0.0125%ICP
Tl301,000ICP
V1010,000ICP
W105,000ICP
Y11,000ICP
Zn1010,000ICP

This method is suitable for mineralized ore samples and offers increased analytical limits. Samples are fused with sodium peroxide in a Zirconium crucible. The fused sample is acidified with concentrated nitric and hydrochloric acids. The resulting solutions are diluted and then measured by ICP-OES. All metals are solubilized.

ICP-OES

Samples are analyzed with a minimum of 10 certified reference materials for the required analytes, all prepared by sodium peroxide fusion. Every 10th sample is prepared and analyzed in duplicate; a blank is prepared every 30 samples and analyzed. Samples are analyzed using an ICP and internal standards are used as part of the standard operating procedure.

Elements and Detection Limits (ppm)

ElementDetection LimitUpper LimitReported By
Al0.0125%ICP
As302,000ICP
B20010,000ICP
Ba410,000ICP
Be21,000ICP
Bi105,000ICP
Ca0.0240%ICP
Cd0.55,000ICP
Ce505,000ICP
Co0.00230%ICP
Cr0.00250%ICP
Cu0.00150%ICP
Fe0.0170%ICP
Ga155,000ICP
K0.1050%ICP
La310,000ICP
Li0.00130%ICP
Mg0.0130%ICP
Mn0.00550%ICP
Mo250,000ICP
Ni0.00530%ICP
P0.0014%ICP
Pb0.00230%ICP
S0.0125%ICP
Sb1510,000ICP
Sc55,000ICP
Se505,000ICP
Si0.0250%ICP
Sn1010,000ICP
Sr510,000ICP
Te6010,000ICP
Th601,000ICP
Ti0.0150%ICP
Tl301,000ICP
V5010,000ICP
W105,000ICP
Y101,000ICP
Zn1010,000ICP

8-Peroxide Fusion

This assay method is ideal for base metals such as Cu, Pb, Zn, Ni and refractory elements such as Mo, Nb, Ta, As, Cr, Ti as well as a range of other elements. Please contact us to determine the best suitability for your application.

Samples are fused with Na2O2 in Zirconium crucibles.  The fused sample is dissolved in purified water and acidified with concentrated nitric and hydrochloric acids. The solution is then measured by an ICP. Samples are analyzed with a minimum of 10 certified reference materials for the required analytes, all prepared by sodium peroxide fusion. Every 10th sample is prepared and analyzed in duplicate; a blank is prepared every 30 samples and analyzed.

Code 8 Peroxide ICP-OES Elements and Detection Limits

ElementDetection Limit
Mg0.01%
Mn0.01%
Ni0.005%
Pb0.01%
S0.01%
Sb0.01%
Si0.01 - 47 %
Ti0.01%
W0.005%
Zn0.01%

Samples are fused with sodium peroxide in a Zirconium crucible. The fused sample is acidified with concentrated nitric and hydrochloric acids. The resulting solutions are diluted and then measured by an ICP-MS. Calibration is performed using five synthetic calibration standards. A set of (10-20) fused certified reference material is run with every batch of samples for calibration and quality control. Fused duplicates are run every 10 samples.

ElementDetection Limit
Al0.001  %
As0.001-2%
Be0.001%
Bi0.001%
Ca0.01 %
Co0.001 %
Cr0.01 %
Cs0.001 %
Cu0.001 %
Fe0.05 %
Ga0.001 %
Ge0.001 %
In0.001 %
K0.1 %
Li0.01 %
Mg0.01 %
Mn0.01 %
Mo0.001  %
 
ElementDetection Limit
Nb0.001 %
Ni0.001 %
Pb0.001 %
Re0.001 %
S0.01 %
Sb0.00%
Se0.001 %
Si0.01 - 47 %
Sn0.001 %
Ta0.001 %
Te0.001 %
Th0.001 %
Ti0.01 %
Tl0.001 %
U0.001 %
W0.001 %
Zn0.001 %